Ключевые слова: LTS, Nb3Sn, wires, mechanical properties, strain effects, pinning force, numerical analysis, modeling
Cheggour N., van der Laan D.C., Lu X. F., Goodrich L. F., Splett J. D., Holesinger T. G., Baca F. J.
Jewell M.C., Cheggour N., Krooshoop H.J., Devred A., Nijhuis A., Stauffer T.C., Lu X.F., Nabara Y., Goodrich L.F., Splett J.
Ключевые слова: LTS, Nb3Sn, wires, mechanical properties, irreversible strain, measurement technique
Larbalestier D.C., Cheggour N., Ghosh A.K., Stauffer T.C., Lu X.F., Lee P.J., Goodrich L.F., Motowidlo L.R., Distin J.S.
Gregory E., Tomsic M., Cheggour N., Sumption M.D., Ghosh A., Peng X., Stauffer T.C., Lu X.F., Goodrich L.F., Splett J.D.
Holesinger T.G., Clickner C.C., Cheggour N., Stauffer T.C., Lu X.F., Trociewitz U., Goodrich L.F., Myers D.
Ключевые слова: LTS, Nb3Sn, doping effect, RRP process, strands, critical caracteristics, mechanical properties, critical current, strain effects, n-value
Ключевые слова: presentation, HTS, YBCO, coated conductors, mechanical properties, stress effects, strain effects, bending process, tensile tests, joints, joint resistances, critical current, current-voltage characteristics, films, substrate SrTiO3, measurement setup, dielectrics, critical caracteristics, electromechanical analysis
Ключевые слова: HTS, YBCO, coated conductors, mechanical properties, joints, measurement setup, dielectrics, funding, plans, collaborations, presentation, electromechanical analysis
Thieme C.L., Ekin J.W., Xie Y., Cheggour N.(cheggour@ boulder.nist.gov)
Cheggour N., Laan D.C.(danko@boulder.nist.gov)
Ключевые слова: HTS, YBCO, coated conductors, mechanical properties, strain effects, bending process, MOCVD process, IBAD process, critical current density, tensile tests, MOD process, RABITS process, comparison, grain structure, dielectrics, stress effects, presentation, critical caracteristics, fabrication, experimental results, electromechanical analysis
Ключевые слова: presentation, HTS, YBCO, coated conductors, ac losses, joints, geometry effects, assembled conductors, filaments, bridges, ac losses, stabilizing layers, heat treatment, stability, n-value, Bi2223, tapes, joint resistances, cables, power equipment
Ключевые слова: HTS, YBCO, coated conductors, stress effects, fatigue behavior, mechanical properties, IBAD process, RABITS process, coated conductors multifilamentary, crack formation, MOD process, MOCVD process, comparison, critical current density, degradation studies, experimental results, critical caracteristics, fabrication
Ключевые слова: presentation, HTS, coated conductors, measurement technique, stabilizing layers, critical current density, strain effects, mechanical properties, critical caracteristics, RABITS process, IBAD process, comparison, fatigue behavior, cycling, tensile tests, bending process, experimental results
Thieme C.L., Goyal A., Ekin J.W., Qiao Y., Cheggour N., Clickner C.C.(clickner@boulder.nist.gov), Xie Y.-Y
Ekin J.W., Li Y., Xiong X., Qiao Y., Reeves J., Knoll A., Lenseth K., Iwasa Y., Civale L., Maiorov B., Suenaga M., Selvamanickam V., Cheggour N., Chen Y., Salagaj T., Weber C., Xie Y.-Y.(yxie@igc.com), Solovyov V., Clickner C., Hou P.
Cheggour N.(cheggour@boulder.nist.gov), Ekin J.W., Feenstra R., Xie Y., Selvamanickam V., Thieme C.L.H.
Ключевые слова: HTS, YBCO, coated conductors, stabilizing layers, substrate Hastelloy, IBAD process, MOCVD process, electroplating process, substrate Ni-W, RABITS process, MOD process, laminations, strain effects, critical current, critical current density, n-value, experimental results, critical caracteristics, fabrication, mechanical properties
Thieme C.L., Goyal A., Verebelyi D.T., Cheggour N.(cheggour@boulder.nist.gov), Ekin J.W., Clickner C.C., Feenstra R.
Goyal A., Paranthaman M., Verebelyi D.T., Ekin J.W., Clickner C.C., Feenstra R., Cheggour N., Thieme C.L.H.
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